Abstract:Modern analytical tools, from microfocus X-ray diffraction (XRD) to electron microscopy-based microtexture measurements, offer exciting possibilities of diffraction-based multiscale residual strain measurements. The different techniques differ in scale and resolution, but may also yield significantly different strain values. This study, for example, clearly established that high-resolution electron backscattered diffraction (HR-EBSD) and high-resolution transmission Kikuchi diffraction (HR-TKD) [sensitive to changes in interplanar angle (Δθθ)], provide quantitatively higher residual strains than micro-Laue XRD and transmission electron microscope (TEM) based precession electron diffraction (PED) [sensitive to changes in interplanar spacing (Δdd)]. Even after correcting key known factors affecting the accuracy of HR-EBSD strain measurements, a scaling factor of ∼1.57 (between HR-EBSD and micro-Laue) emerged. We have then conducted "virtual" experiments by systematically deforming an ideal lattice by either changing an interplanar angle (α) or a lattice parameter (a). The patterns were kinematically and dynamically simulated, and corresponding strains were measured by HR-EBSD. These strains showed consistently higher values for lattice(s) distorted by α, than those altered by a. The differences in strain measurements were further emphasized by mapping identical location with HR-TKD and TEM-PED. These measurements exhibited different spatial resolution, but when scaled (with ∼1.57) provided similar lattice distortions numerically.

Effect of Reference Region Size on Strain Measurements Using Geometrical Phase Analysis.

Mapping the Strain Distribution Within Embedded Nanoparticles Via Geometrical Phase Analysis.

Subset geometric phase analysis method for deformation evaluation of HRTEM images.

Geometric Phase Analysis Method Using a Subpixel Displacement Match Algorithm

Geometric Phase Analysis Based on the Windowed Fourier Transform for the Deformation Field Measurement

Artefacts in geometric phase analysis of compound materials

A geometric phase analysis method dedicated to nanomaterials orienting along high-index zone axis.

The geometric phase analysis method based on the local high resolution discrete Fourier transform for deformation measurement

A Hybrid Method for Lattice Image Reconstruction and Deformation Analysis

The effect of scanning jitter on geometric phase analysis in STEM images.

Influence of specimen dimensions and strain measurement methods on tensile stress–strain curves

3D geometric phase analysis and its application in 3D microscopic morphology measurement

Three-dimensional geometric phase analysis and its application in 3D microscopic morphology measurement

Quantitative Measurement of Deformation Field Around Low-Angle Grain Boundaries by Electron Microscopy

Strain Mapping in Nanocrystalline Grains Simulated by Phase Field Crystal Model

Shape-dependent local strain in gold nanorods: data-driven atomic-resolution electron microscopy analysis

Diffraction-Based Multiscale Residual Strain Measurements

A New Method to Reliably Determine Elastic Strain of Various Crystal Structures from Atomic-Resolution Images

Phase-field Simulation of Effects of Normal Strain on the Morphology and Kinetics Evolution of Nanoscale Phase

Experimental examination of strain field within GP zone in an Al–Zn–Mg–Cu alloy

Strain mapping in symmetrical core-shell gold nanorods from HRTEM images