Abstract:Modern analytical tools, from microfocus X-ray diffraction (XRD) to electron microscopy-based microtexture measurements, offer exciting possibilities of diffraction-based multiscale residual strain measurements. The different techniques differ in scale and resolution, but may also yield significantly different strain values. This study, for example, clearly established that high-resolution electron backscattered diffraction (HR-EBSD) and high-resolution transmission Kikuchi diffraction (HR-TKD) [sensitive to changes in interplanar angle (Δθθ)], provide quantitatively higher residual strains than micro-Laue XRD and transmission electron microscope (TEM) based precession electron diffraction (PED) [sensitive to changes in interplanar spacing (Δdd)]. Even after correcting key known factors affecting the accuracy of HR-EBSD strain measurements, a scaling factor of ∼1.57 (between HR-EBSD and micro-Laue) emerged. We have then conducted "virtual" experiments by systematically deforming an ideal lattice by either changing an interplanar angle (α) or a lattice parameter (a). The patterns were kinematically and dynamically simulated, and corresponding strains were measured by HR-EBSD. These strains showed consistently higher values for lattice(s) distorted by α, than those altered by a. The differences in strain measurements were further emphasized by mapping identical location with HR-TKD and TEM-PED. These measurements exhibited different spatial resolution, but when scaled (with ∼1.57) provided similar lattice distortions numerically.

A Hybrid Method for Lattice Image Reconstruction and Deformation Analysis

Subset geometric phase analysis method for deformation evaluation of HRTEM images.

Isotropic three-dimensional imaging with lattice light-sheet difference microscopy.

Geometric Phase Analysis Method Using a Subpixel Displacement Match Algorithm

The geometric phase analysis method based on the local high resolution discrete Fourier transform for deformation measurement

Geometric Phase Analysis Based on the Windowed Fourier Transform for the Deformation Field Measurement

Quantitative Phase and Amplitude Imaging with an Efficient Support Constraint.

The digital geometric phase technique applied to the deformation evaluation of MEMS devices

3D geometric phase analysis and its application in 3D microscopic morphology measurement

Three-dimensional geometric phase analysis and its application in 3D microscopic morphology measurement

Uncovering Material Deformations via Machine Learning Combined with Four-Dimensional Scanning Transmission Electron Microscopy

Geometric phase analysis of magnetic skyrmion lattices in Lorentz transmission electron microscopy images

A New Method for the Reconstruction of Micro- and Nanoscale Planar Periodic Structures

HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale

A study on the digital nano-moiré method and its phase shifting technique

Model-driven CT reconstruction algorithm for nano-resolution X-ray phase contrast imaging

A posterior approach to correct for focal plane offsets in lattice light sheet structured illumination microscopy

Real-space post-processing correction of thermal drift and piezoelectric actuator nonlinearities in scanning tunneling microscope images

Diffraction-Based Multiscale Residual Strain Measurements

Deformation Fields Measurement of Crack Tip under High-Frequency Resonant Loading Using a Novel Hybrid Image Processing Method