Enhanced Dielectric Performance of BaxSr(1-x)TiO3 Films Prepared by the Direct Current Micro-Arc Oxidation in the Presence of Ethylenediamine Tetraacetic Acid

Min Wang,Xi Zuo,Wenfang Li,Genghua Cao,An Xiang
DOI: https://doi.org/10.1016/j.tsf.2019.137579
IF: 2.1
2020-01-01
Thin Solid Films
Abstract:BaxSr((1-x))TiO3 (BST) thin-films are fabricated on a Ti-substrate by micro-arc oxidation method in the presence of an aqueous solution of ethylenediamine tetraacetic acid (EDTA) and effects of EDTA, as additive, are investigated on the micro-structure and dielectric properties of BST thin-films. The obtained results show that EDTA delays the micro-arc oxidation reaction and results in a controllable slow-growth of the thin-film. Although, a remarkable thin film is obtained, however, capacitance of the prepared film is prominently increased. When concentration of EDTA is 0.05 M, the best compactness and smoothness for the film are observed. Moreover, the largest dielectric constant and smallest dielectric-loss are attained. In addition, the largest residual polarization strength (2Pr) of 3.4 mu C/cm(2) is also attained under this condition.
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