Afterpulsing in Ge-on-Si Single-Photon Avalanche Diodes

G. Buller,D. Dumas,Xin Yi,Dave Muir,J. Kirdoda,L. Ferre-Llin,R. Millar,Lisa Saalbach,Fiona Fleming,Z. Greener,Douglas J. Paul
DOI: https://doi.org/10.1109/LPT.2023.3289653
IF: 2.6
2023-09-01
IEEE Photonics Technology Letters
Abstract:In this letter, we investigate afterpulsing in 26 and <inline-formula> <tex-math notation="LaTeX">$100~\mu \text{m}$ </tex-math></inline-formula> diameter planar geometry Ge-on-Si single-photon avalanche diode (SPAD) detectors, by use of the double detector gating method with a gate width of 50 ns. Ge-on-Si SPADs were found to exhibit a 1% afterpulsing probability at a delay time of <inline-formula> <tex-math notation="LaTeX">$200~\mu \text{s}$ </tex-math></inline-formula> and temperature of 78 K, and <inline-formula> <tex-math notation="LaTeX">$130~\mu \text{s}$ </tex-math></inline-formula> at a temperature of 150 K. These delay times were measured with an excess bias of 3.5% applied, which corresponded to a single-photon detection efficiency of 15% at <inline-formula> <tex-math notation="LaTeX">$1.31~\mu \text{m}$ </tex-math></inline-formula>. We demonstrate that reducing the detector diameter can also be an effective way to restrict afterpulsing in this material system.
Engineering,Physics
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