A Switched Capacitor Waveform Digitizing ASIC at Cryogenic Temperature for HPGe Detectors

Feng Liu,Zhi Deng,Xinyuan Zhao,Yinong Liu
DOI: https://doi.org/10.1109/tns.2021.3095845
IF: 1.703
2021-01-01
IEEE Transactions on Nuclear Science
Abstract:A cryogenic waveform digitizer ASIC (CryoSCA) based on switched capacitor array has been developed for HPGe detector array for dark matter (CDEX: China Dark Matter Experiment) and neutrino experiments. A 180 nm CMOS process was used and the I-V characterization of the MOS transistors was firstly measured at liquid nitrogen. Higher threshold voltage, improved carrier mobility, smaller subthreshold slope and higher gain were observed and measured than room temperature. CryoSCA has integrated 16 channels of waveform sampling and digitization circuit. Each channel consists of two sample blocks of 32-cell working in ping-pong mode, a 256-cell storage block and 32 parallel Wilkinson type ADCs. The digitized data will be sent out in serial. The sampling frequency is up to 100 MS/s and the resolution is above 10 bit at liquid nitrogen. The ADC conversion time is about 50 μs and the readout frequency is up to 200 MHz. Several design techniques have been adopted for low temperature operation, including adjusting bias externally and bandgap referred ramp current. The power consumption of core structure is simulated to be 2.3mW/ch, the INL of the ASIC can be better than 0.2% for 1 V dynamic range. Detailed design and test results will be present in the paper.
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