Effect of Deposition Working Power on Physical Properties of RF-Sputtered CdTe Thin Films for Photovoltaic Applications

Ana-Maria Răduță,Ana-Maria Panaitescu,Marina Manica,Sorina Iftimie,Vlad-Andrei Antohe,Ovidiu Toma,Adrian Radu,Lucian Ion,Mirela Petruta Suchea,Ștefan Antohe

DOI: https://doi.org/10.3390/nano14060535

IF: 5.3

2024-03-18

Nanomaterials

Abstract:The main objective of this study was to determine the variation in the properties of cadmium telluride (CdTe) thin films deposited on a p-type Si substrate by the radio frequency magnetron sputtering technique at four different working powers (70 W, 80 W, 90 W, and 100 W). The substrate temperature, working pressure, and deposition time during the deposition process were kept constant at 220 °C, 0.46 Pa, and 30 min, respectively. To study the structural, morphological, and optical properties of the CdTe films grown under the mentioned experimental conditions, X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM), and optical spectroscopy were used. For a better analysis of the films’ structural and optical properties, a group of films were deposited onto optical glass substrates under similar deposition conditions. The electrical characterisation of Ag/CdTe/Al “sandwich” structures was also performed using current–voltage characteristics in the dark at different temperatures. The electrical measurements allowed the identification of charge transport mechanisms through the structure. New relevant information released by the present study points towards 90 W RF power as the optimum for obtaining a high crystallinity of ~1 μm nanostructured thin films deposited onto p-Si and optical glass substrates with optical and electrical properties that are suitable for use as absorber layers. The obtained high-quality CdTe nanostructured thin films are perfectly suitable for use as absorbers in CdTe thin-film photovoltaic cells.

materials science, multidisciplinary,physics, applied,nanoscience & nanotechnology,chemistry

What problem does this paper attempt to address?

The problem that this paper attempts to solve is the change in the physical properties of CdTe thin films prepared by radio - frequency magnetron sputtering (RF - MS) at different working powers (70 W, 80 W, 90 W, and 100 W). Specifically, the research aims to explore the influence of working power on the structure, morphology, optical and electrical properties of CdTe thin films, in order to find the optimal working power conditions and thus obtain CdTe nanostructured thin films with high crystallinity and suitable for use as absorption layers in photovoltaic applications. In the study, the films were deposited on p - type silicon substrates and optical glass substrates, and during the experiment, the substrate temperature, working pressure and deposition time were kept constant at 220 °C, 0.46 Pa and 30 minutes respectively. The properties of the films were analyzed by means of X - ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM) and spectroscopy, etc., and current - voltage characteristic measurements were carried out to evaluate the electrical properties of the films. The study found that a working power of 90 W is the best condition for obtaining high - quality CdTe nanostructured thin films, and these films have good optical and electrical properties and are suitable for use as the absorption layer in CdTe thin - film photovoltaic cells.