Phase Composition and Electrical Properties of K0.4Na0.6Nb1-xTaxO3 Lead-Free Thin Films

Na Li,Weili Li,Lidong Wang,Weidong Fei,Chunzhong Liu
DOI: https://doi.org/10.1080/00150193.2019.1611100
2019-01-01
Ferroelectrics
Abstract:Lead-free K0.4Na0.6Nb1-xTaxO3 thin films with V2O5 seed layer were prepared by chemical solution deposition method with the annealing temperatures of 675 degrees C. Phase composition and microstructures at room temperature were analyzed by X-ray diffraction and scanning electron microscope. The ferroelectric property and dielectric property were tested for the thin films. The results indicate that the K0.4Na0.6Nb1-xTaxO3 thin films are composed of orthorhombic and tetragonal phases, and the phase contents are affected by the content of Ta doping. The K0.4Na0.6Nb1-xTaxO3 (x = 0.015) thin film with the maximum amount of T phase content and homogeneous surface morphology obtains the best ferroelectric property and dielectric property.
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