Analysis of Step Phenomenon in LightningImpulse Test in UHVGIS

LIU Xuandong,ZHANG Lingli,WANG Shuai,WEN Tao,ZHANG Qiaogen
DOI: https://doi.org/10.13335/j.1000-3673.pst.2016.2218
2017-01-01
Abstract:With increase of voltage level, application of gas-insulated metal-enclosed switchgear (GIS) becomes more and more extensive. To ensure insulationreliability, itis necessary to carry out on-site voltage withstand and insulation test of GIS before puttinginto service. Lightning impulse voltage withstand test is one of tests which must be carried out onsite. However, it is found that there exist waveform distortion problems during field test, and so-called "step"phenomenon occursat rising edge of lightning impulse voltage. UsingATP-EMTPsoftware, a test system modelisbuiltto calculate voltage propagation in UHV GIS loadandanalyze reasons for occurrence of step phenomenon.Simulation results show that step phenomenon is caused by interaction between distribution characteristics of load andsurgeimpedance of different electrical processes. Negative voltage reflection generated by concentrated loads at high-voltage lead,branch bus nodesandbranch bus terminal is major reason causing"step" phenomenon.Amethodisproposedtodetermine wave front time of test voltage waveform with a "step"based on above research.
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