Gate-Sensing Charge Pockets in the Semiconductor Qubit Environment

X. G. Croot,S. J. Pauka,M. C. Jarratt,H. Lu,A. C. Gossard,J. D. Watson,G. C. Gardner,S. Fallahi,M. J. Manfra,D. J. Reilly
DOI: https://doi.org/10.1103/physrevapplied.11.064027
IF: 4.6
2017-01-01
Physical Review Applied
Abstract:We report the use of dispersive gate sensing (DGS) as a means of probing the charge environment of heterostructure-based qubit devices. The DGS technique, which detects small shifts in the quantum capacitance associated with single-electron tunnel events, is shown to be sensitive to pockets of charge in the potential-landscape likely under, and surrounding, the surface gates that define qubits and their readout sensors. Configuring a quantum point contact (QPC) as a localized emitter, we show how these charge pockets are activated by the relaxation of electrons tunneling through a barrier. The presence of charge pockets creates uncontrolled offsets in gate-bias and their thermal activation by on-chip tunnel currents suggests further sources of charge-noise that lead to decoherence in semiconductor qubits.
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