Microstructures and Dielectric Properties of (na0.5bi0.5)0.775ba0.225ti0.775sn0.225o3 Relaxor Ferroelectric with Bi2O3–B2O3–ZnO Glass Addition

Min Chen,Tianchen Wei,Lei Zhang,Xin Peng,Xu Guo,Ruike Shi,Yongping Pu

DOI: https://doi.org/10.1007/s10854-019-01490-y

2019-01-01

Journal of Materials Science Materials in Electronics

Abstract:To further manipulate the dielectric properties of (Na0.5Bi0.5)0.775Ba0.225Ti0.775Sn0.225O3 ceramics, (Na0.5Bi0.5)0.775Ba0.225Ti0.775Sn0.225O3 − x wt% Bi2O3–B2O3–ZnO (BBZ) ceramics were prepared via a conventional solid state reaction method, whilst the effect of BBZ glass content on dielectric and ferroelectric properties was investigated. In XRD patterns, the minimal secondary phase of Zn3(BO3)2 can be detected in these compounds when x > 5. With the addition of BBZ glass, diffuse phase transition behavior (DPT) and the high temperature stability of permittivity were enhanced. When x = 7, a high permittivity of 1600 ± 15%, from ~ 50 to ~ 475 °C was obtained. Additionally, a high Wd of 1.4 J/cm3 and of 75.5% (measured at 150 kV/cm) were achieved due to the enhanced Pm of 24 μC/cm2. This work demonstrated that the study on (Na0.5Bi0.5)0.775Ba0.225Ti0.775Sn0.225O3 ceramics with BBZ glass addition providing an adequate strategy to enhance Pm.