A Fast Evaluation Method for Spatial Point Measurement Accuracy in a Large-Scale Measurement System
Yusong Liu,Wenbo Guo,Yuanyuan Pang,Bo Zheng
DOI: https://doi.org/10.3390/electronics13132428
IF: 2.9
2024-06-22
Electronics
Abstract:In the application domain of large-scale high-precision measurement systems, accurately calibrating the precision of point position measurements is a pivotal issue. Traditional calibration methods rely on laser interferometers and high-precision displacement stages, which are not only costly but also challenging to implement in fixed measurement systems. Addressing this challenge, this study introduces an evaluation method for the spatial point measurement accuracy in large-scale fixed high-precision measurement systems. The models for the relationship between the limit deviation and the maximum deviation of finite measurements were established, as well as the limit deviation and point position measurement accuracy. The spatial point position accuracy of the measurement field was calculated by the measurement errors of a calibration rod. The algorithm was validated using a large-scale measurement platform based on photogrammetric technology. Experimental results demonstrate that the method achieved a point position measurement accuracy calibration better than 0.1 mm within a 20 m measurement range, effectively enhancing the measurement data's accuracy and reliability. This research optimizes the calibration process for large-scale fixed measurement systems, improves calibration efficiency, and obviates the need for complex equipment to complete the calibration process, which is of considerable importance to the development of high-precision spatial point position measurement technology.
engineering, electrical & electronic,computer science, information systems,physics, applied