Crystal Growth Of Alpha-Hgi2 By The Temperature Difference Method For High Sensitivity X-Ray Detection

Zhaojun Zhang,Wei Zheng,Anqi Chen,Kai Ding,Feng Huang
DOI: https://doi.org/10.1021/acs.cgd.5b00468
IF: 4.01
2015-01-01
Crystal Growth & Design
Abstract:alpha-HgI2 is a promising material for room temperature X-ray detection. A facile temperature difference method is designed to grow 4 x 4 x 2 mm(3) a-HgI2 bulk crystal from KI aqueous solution. Characterization results indicate the as-grown high quality crystals are single-crystalline and possess a standard bandgap (E-g = 2.16 eV at 300 K) and high electrical resistivity (10(10) Omega.cm). Utilizing the as-grown crystal, moreover, a photoconductive type prototype X-ray detector is fabricated. The detector behaves at high X-ray sensitivity, which is improved by one order of magnitude in comparison with previous results from solution grown alpha-HgI2. In addition to alpha-HgI2, the crystal growth of other halides materials which are used for X-ray detection, e.g., PbI2, HgBr2, BiI3, may also benefit from the presented temperature difference method.
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