Growth of the Bi2Se3 Surface Oxide for Metal–Semiconductor–Metal Device Applications

Yun-Chieh Yeh,Po-Hsun Ho,Cheng-Yen Wen,Guo-Jiun Shu,Raman Sankar,Fang-Cheng Chou,Chun-Wei Chen
DOI: https://doi.org/10.1021/acs.jpcc.5b10425
2016-01-01
The Journal of Physical Chemistry C
Abstract:The effect of the surface structure of Bi2Se3 on its interior properties has been well studied recently, but the interfacial structure and electrical properties of the oxidized Bi2Se3 surface are little known. In contrast to the self-limited formation of native oxide on Bi2Se3, the degree of oxidation on the Bi2Se3 surface in oxygen plasma is enhanced. Results of transmission electron microscopy and X-ray photoelectron spectroscopy show that the surface of the oxidized Bi2Se3 is composed of a layer of amorphous bismuth oxide (BiOx), and the thickness of the BiOx layer can be controlled by the length of the plasma process. Electrical measurements of this structure present the Schottky-type transport property at the interface between the oxidized layer and the bulk Bi2Se3 crystal, and the turn-on voltage depends on the thickness of the surface BiOx layer. This study of the structure, formation mechanism, and electrical properties of the surface oxide of Bi2Se3 formed in oxygen plasma provides useful information for future development of electronic devices based on bismuth chalcogenides.
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