A Study of Spectral Statistical Properties of Extreme Ultraviolet-Boosted Photo-Ionization for Precise In-Situ Measurement of an Intense Laser Pulse

Yucheng Ge,Yiwen Ju,Xiangjie Ge
DOI: https://doi.org/10.1166/jnn.2017.14418
2017-01-01
Journal of Nanoscience and Nanotechnology
Abstract:Characterizing an intense laser pulse for use is challenging. Study shows that the photoelectron energy spectrum generated by an intense laser pulse in the presence of a spatially correlated continuous extreme ultraviolet (XUV) has interesting and useful statistical properties. The total photoionization production is linearly proportional to the time duration of the laser pulse and the square of the beam size. The spectral double energy-integration is an intrinsic value of the laser-assisted XUV photoionization, which linearly depends on the laser intensity and quantitatively reflects the strengths of the laser-field modulation and quantum interference between photoelectrons. The spectral energy width is also linearly dependent on the laser intensity. These linear relationships suggest new methods for in-situ measurement of laser intensity and pulse duration with high precisions.
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