X-ray-boosted Photoionization for the Measurement of an Intense Laser Pulse

Ge Yu-Cheng,He Hai-Ping
DOI: https://doi.org/10.1088/1674-1056/22/6/063201
2013-01-01
Abstract:Investigations show that X-ray-boosted photoionization(XBP) has the following advantages for in-situ measurements of ultrahigh laser intensity I and field envelope F(t)(time t,pulse duration τL,carrier-envelope-phase Φ):accuracy,dynamic range,and rapidness.The calculated XBP spectra resemble inversely proportional functions of the photoelectron momentum shift.The maximum momentum p and the observable value Q(defined as a double integration of a normalized photoelectron energy spectrum,PES) linearly depend on I1/2 and τL,respectively.Φ and F(t) can be determined from the PES cut-off energy and peak positions.The measurable laser intensity can be up to and over 1018 W/cm2 by using high energy X-rays and highly charged inert gases.
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