A New Method for Directly Measuring Frequency and Intensity Temporal Profiles of Attosecond XUV Pulse Simultaneously and Completely

YC Ge
DOI: https://doi.org/10.7498/aps.54.2653
IF: 0.906
2005-01-01
Acta Physica Sinica
Abstract:A new method of phase determination is presented to measure the frequency and intensity temporal profiles of attosecond XUV pulses directly, simultaneously and completely. Using a cross correlation between femtosecond laser and attosecond X UV, such profiles can be reconstructed from photoelectron energy spectra measure d with two different laser intensities at 0° and 180° with respect to the line ar laser polarization. The method has a temporal measurement range from a quarte r to about half of laser oscillation period. The temporal resolution depends on the jitter and control precision of the laser and XUV pulses. The method can be used for ultra_fast measurement on attosecond time scale.
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