Micro-assembly Force Measurement Using Blur Image Analysis

JIANG Ru-yi,LIU Hong-tao,HU Wen,LIANG Qing-hua,WANG Shi-gang
DOI: https://doi.org/10.16183/j.cnki.jsjtu.2010.08.006
2010-01-01
Abstract:A new approach based on machine vision to measure the force during micro-assembly was proposed.After the acquisition of out-of-focus blur image of micro-gripper under force,with the established model of the relationship between the force and the out-of-focus blur parameter,the problem of force measurement is transformed into that of blur parameter identification.A coarse-fine blur identification method is then put forwarded,where micro-gripper's bending curve is used for curve fitting the blur parameters.The coefficient of the fitted curve has a direct relationship with the force.The simulation results show this method's validity.
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