Absolute Profile Test by Multi-Sensor Scanning System with Relative Angle Measurement

Dede Zhai,Shanyong Chen,Xiaoqiang Peng,Guipeng Tie
DOI: https://doi.org/10.1088/1361-6501/aade0d
2018-01-01
Abstract:In this paper, we present a novel method using an interferometer as a multi-sensor for an absolute profile test. Different from the traditional three flat test, which is complex to implement, the configuration of our method is similar to a classical sub-aperture stitching test but double scanning with different intervals is required. An additional interferometer or auto-collimator is used to measure relative tilt during scanning. The method we propose can eliminate not only systematic error in the interferometer but also the height offset error of the scanning stage, and it can achieve high lateral resolution. We analyze the effect of tilt estimation error on reconstruction accuracy and then propose a way to reduce its effect. The simulation results indicate our method can get exact results when free of noise. Comparisons are made between our method and the previously proposed sub-profile stitching method. The experiment results show that high repeatability and high accuracy can be reached in our method.
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