Decoding the Structural Origin of Piezoelectric and Thermoelectric Materials with Aberration-Corrected STEM

Haijun Wu,Stephen J. Pennycook
DOI: https://doi.org/10.1017/s1431927618000855
IF: 4.0991
2018-01-01
Microscopy and Microanalysis
Abstract:Aberration-corrected scanning transmission electron microscopy (STEM) has developed into a most powerful characterization and even fabrication platform for materials. This is especially so for functional materials with complex structural features that dynamically respond to external fields. Thoroughly understanding and tailoring structural defects is extremely significant for understanding the structureproperty relations of existing high-performance materials, and more importantly, guiding the design of new materials with improved properties. Here we show examples of new insights obtained from two representative functional materials, piezoelectric and thermoelectric materials. Results were obtained with the newly set-up JEOL ARM200F STEM with ASCOR aberration corrector, cold field emission gun, UHR pole piece, Gatan Quantum ER spectrometer, OneView camera and Oxford Aztec EDS system at the National University of Singapore.
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