Research On Error Analysis And Error Allocation Technology Of Metrology System For Electronic Components Test Bench

Chunling Yang,Ming Liu,Min Zhu,Miao Zhang
DOI: https://doi.org/10.1109/iciea.2018.8398058
2018-01-01
Abstract:Based on metrology system for electronic components test bench, the error analysis models of each part of the system design are established and the error calculation results of each part for the system measurement are given in this paper. In order to further improve the precision of the metrology system, the corresponding error allocation scheme is proposed. The feasibility analysis is carried out based on the theory of error allocation.
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