Research on intelligent analysis device for dynamic error of electric energy

Wenjing Yang,Gang Wang,Wei Gao,Jingyu Yin,Weitao Wu

DOI: https://doi.org/10.1063/5.0184327

IF: 1.697

2024-01-01

AIP Advances

Abstract:With the development of smart grids, the introduction of intermittent energy and the increase in dynamic loads have led to more and more dynamic characteristics of electricity loads in the grid. Intelligent energy meters that passed calibration under steady-state load may not necessarily meet the measurement error requirements under the excitation of dynamic load test signals, and some may even produce significant errors. At present, research on dynamic error testing of intelligent energy meters mainly focuses on establishing models of dynamic error testing signals, and the reasons for the generation of dynamic errors are still unclear. In order to analyze the sources of dynamic errors in intelligent energy meters, this article adopts a mechanism modeling method to establish a full system model of intelligent energy meters, in order to analyze the influence of model parameters of each unit on the dynamic errors of active energy, and provide important theoretical reference for further improving the dynamic error characteristics of energy meters. In addition, identifying the sources of errors has important application value for improving the algorithm of energy metering chips, optimizing the overall design of energy meters, and selecting energy meters in dynamic load scenarios for the power sector.

materials science, multidisciplinary,physics, applied,nanoscience & nanotechnology

What problem does this paper attempt to address?

The problem that this paper attempts to solve is the measurement error of smart electricity meters under dynamic load conditions. Specifically, the paper focuses on:

1. **Analysis of Dynamic Error Sources**: The paper establishes a full - system model of the smart electricity meter through the mechanism - modeling method to analyze the influence of each unit model parameter on the dynamic error of active electric energy. This helps to further improve the dynamic error characteristics of the electricity meter.

2. **Deficiencies in Existing Research**:
- Although an input - output model of PGA with a fixed steady - state gain has been established, there is a lack of dynamic models for the dynamic change of PGA gain and dynamic error analysis models.
- For the active power measurement unit, using the steady - state power measurement algorithm substitution model can only analyze the error under steady - state voltage and current conditions, and cannot analyze the dynamic output response when the input measurement current or power signal fluctuates rapidly.
- There is a lack of a dynamic model of the electric energy measurement unit, and the influence of the electric energy measurement unit on the dynamic error is not yet clear.
- In addition to the steady - state fixed - gain model of PGA, there is also a lack of a full - system model of other units of the electricity meter and the electric energy metering module, resulting in the inability to analyze the dynamic error transfer relationship of each unit in the system and the influence of PGA dynamic feedback gain switching on the dynamic error of the electricity meter.

3. **Solutions**: The paper adopts the mechanism - modeling method to establish a mathematical model of the voltage channel of the electricity meter, a mathematical model of the PGA gain feedback control of the current channel, a dynamic model of the active power measurement unit and a dynamic model of the electric energy measurement unit, analyzes the dynamic error transfer relationship between each unit, and establishes a comprehensive system model of the electricity meter to solve the problem of dynamic error sources.

Through these models and analyses, the paper aims to provide a theoretical reference, improve the algorithm of the electric energy metering chip, optimize the overall design of the electricity meter, and select an appropriate electricity meter in dynamic load scenarios.