Abstract:Recent technical advances in scanning transmission electron microscopy (STEM) and xray detector technology have made it possible to perform atomic-resolution chemical mapping using energy-dispersive x-ray spectroscopy (EDS) [1]. This ability allows for establishing a direct correlation between atomic-scale STEM images, such as high-angle annular dark-field (HAADF) images, and atomic-scale chemical EDS images, making chemical quantification of interfaces, defects and crystalline structure at the atomic-scale possible. Using these capabilities, we have lately quantified the chemical composition of an epitaxial (La0.7Sr0.3)MnO3 (LSMO)/BiFeO3 (BFO) quantum structure [2], cation occupancy in a Sm-doped SrTiO3 (STO) thin film and antiphase boundaries present within STO films [3], as well as determined structures of several intermetallic alloys [4]. In this study, we describe further use of these capabilities to quantify atomic-scale interdiffusion in self-assembled, vertically aligned nanocomposite (VAN) thin films. Self-assembled VAN thin films, consisting of two immiscible components heteroepitaxially grown on single crystals, have experienced an increase in research activity in recent years [5]. These structures offer the advantage of utilizing the functionalities of both components with the possibility of tuning the material’s properties by tailoring the volume ratio of the two components, the interface-to-volume ratio and hetero-epitaxial strain. In addition, modification of interface properties such as structural and elemental distribution across the interface offers an additional dimension to generate new properties and functionalities. The atomic-scale characterization of the interface plays an essential role in understanding the structure-property relationships. Here we describe the characterization of NiO:LSMO and ZnO:LSMO VAN thin

Exchange Bias Effect along Vertical Interfaces in La0.7Sr0.3MnO3:NiO Vertically Aligned Nanocomposite Thin Films Integrated on Silicon Substrates

Exchange Bias Effect and Magnetic Properties in ${\Hbox{la}}_{0.7}{\hbox{sr}}_{0.3}{\hbox{mno}}_{3}\hbox{-}{\Hbox{nio}}$ Nanocomposite Films

Exchange Bias in (110)-Orientated Bi0.9la0.1feo3/La0.5ca0.5mno3 Films

Exchange Bias in a La 0.67 Sr 0.33 MnO 3 /NiO Heterointerface Integrated on a Flexible Mica Substrate

Robust Interfacial Exchange Bias and Metal Insulator Transition Influenced by the Lanio3 Layer Thickness in La0.7sr0.3mno3/Lanio3 Superlattices

Double-Exchange Bias Modulation under Horizontal and Perpendicular Field Directions by 3D Nanocomposite Design

Strain Effects on the Growth of La 0.7 Sr 0.3 MnO 3 (LSMO)–NiO Nanocomposite Thin Films via Substrate Control

Direct visualization and control of SrOx segregation on semiconducting Nb doped SrTiO3 (100) surface

Exchange Bias Effect in Epitaxial LaMnO3+δ Film Induced by Electron Beam Irradiation

Interfacial spin glass mediated unusual spontaneous exchange bias effect in epitaxial self-assembled La0.7Sr0.3MnO3:NiO nanocomposite thin films

Exchange bias in (1 1 0)-orientated Bi 0.9La 0.1FeO 3/La 0.5Ca 0.5MnO 3 films

Bias-dependent Rectifying Properties of N-N Manganite Heterojunctions La1−xCaxMnO3/SrTiO3:Nb (X=0.65–1)

Dielectric Tunability of Vertically Aligned Ferroelectric-Metal Oxide Nanocomposite Films Controlled by Out-of-plane Misfit Strain

Exchange Bias in A Single Lamno3 Film Induced by Vertical Electronic Phase Separation

Exchange Bias Effect in LaFeO3: La0.7Ca0.3MnO3 Composite Thin Films

Atomic-scale EDS Mapping for Chemical Imaging and Quantification of Interdiffusion in Self-assembled Vertically Aligned Nanocomposite Thin Films

Microstructural Underpinnings of Giant Intrinsic Exchange Bias in Epitaxial NiCo2O4 Thin Films

Exchange Coupling-Induced Uniaxial Anisotropy in La 0.7 Sr 0.3 MnO 3 Thin Films

Intrinsic exchange bias from interfacial reconstruction in an epitaxial Ni x Co y Fe3-x- yO4(111)/α-Al2O3(0001) thin film family

The exchange bias in polycrystalline BiFeO 3Ni 81Fe 19 bilayers on Si substrate with LaNiO 3 buffer layer

Exchange-biased Nanocomposite Ferromagnetic Insulator