Implantation-decay Method to Study the Β -Delayed Charged Particle Decay

Yu-Ting Wang,De-Qing Fang,Xin-Xing Xu,Li-Jie Sun,Kang Wang,Peng-Fei Bao,Zhen Bai,Xi-Guang Cao,Zhi-Tao Dai,Bing Ding,Wan-Bing He,Mei-Rong Huang,Shi-Lun Jin,Cheng-Jian Lin,Ming Lü,Long-Xiang Liu,Yong Li,Peng Ma,Jun-Bing Ma,Jian-Song Wang,Shi-Tao Wang,Shao-Qiang Ye,Yan-Yun Yang,Cheng-Long Zhou,Ming-Hui Zhao,Huan-Qiao Zhang,Yu-Gang Ma,Wen-Qing Shen
DOI: https://doi.org/10.1007/s41365-018-0438-5
2018-01-01
Nuclear Science and Techniques
Abstract:In this paper,the implantation-decay method is introduced to study the β-delayed charged particle decay.A silicon detector array was used for the implantation of the incident beams and for the detection of the emitted particles.An experimental measurement on the β-delayed particle emission from 22 Al was used to demonstrate the method.The half-life value,charged particle spectroscopy,γ ray spectrum,and γ particle coincidence for the decay process were obtained and compared with previous experimental results for 22 Al.The results show that the implantation-decay method,using a silicon detector array,is a suitable experimental method to study the β-delayed charged particle decay for proton-rich nuclei.
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