Combined EELS and XAS Analysis of the Relationship Between Depth Dependence and Valence in LSMO Thin Films

Jim Fitch,Robbyn Trappen,Chih-Yeh Huang,Jinling Zhou,Guerau Cabrera,Shuai Dong,Shalini Kumari,Mikel B. Holcomb,James M. LeBeau
DOI: https://doi.org/10.1017/s1431927617008662
IF: 4.0991
2017-01-01
Microscopy and Microanalysis
Abstract:Lanthanum Strontium Manganite (LSMO) thin films are of interest due to their colossal magnetoresistive properties, which originates from double exchange related to the Mn 3+ to Mn 4+ charge states [1].The local magnetic properties of the film are also directly related to the lattice strain at the film/substrate interface, and are tied to the strong lattice-electron interaction related to the MnO6 octahedra in the perovskite structure.The distortion of these octahedra is related to both mechanical strain caused by film/substrate misfit and the radial difference between La and Sr [2].While x-ray characterization methods have illuminated oxidation states in these systems, [3] prior x-ray studies lack the spatial resolution of TEM.While the 3 + to 4 + trend as a function of LSMO thin film thickness is well established [1], the relationship between depth dependence and charge state along with accompanying structural effects is not well documented.
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