Combined iDPC and EELS analyses for quantifying oxygen vacancy concentration in LSMO

J. Lebeau,A. Penn,D. Kumah,Sanaz Koohfar

DOI: https://doi.org/10.1017/S1431927621004505

IF: 4.0991

2021-07-30

Microscopy and Microanalysis

Abstract:Thin film La0.7Sr0.3MnO3 (LSMO) has garnered much attention for use in magnetic memory and spintronic devices due to its colossal magnetoresistance and room temperature ferromagnetism [1]. LSMO’s tunable magnetic character has also prompted fundamental studies on interfacial electronic structure engineering via substrate choice and complex heterostructures to control the strain state and octahedral distortion [2]. In many cases, scanning transmission electron microscopy (STEM) is used for studying thin films because of its ability to expose properties buried beneath the film surface at the atomic scale and in real space. A recent study of multilayered LSMO-La0.7Sr0.3CrO3 heterostructures, however, uncovered a discrepancy in lattice parameters measured with STEM and X-ray diffraction (XRD) due to preferential oxygen vacancy formation in LSMO during STEM sample preparation [3]. In particular, samples for electron microscopy are often prepared by mechanical wedge polishing or focused ion beam milling, where both techniques introduce defects in the material due to harsh preparation environments. Even without external stimulus, LSMO tends to form oxygen vacancies due to Sr-doping, with vacancies forming on the apical positions on the perovskite octahedra [4]. Deciphering the origins of charge variation with electron microscopy thus requires consideration of both the growth conditions and sample preparation.

Physics,Materials Science