Writing Field Analysis for Shingled Bit-Patterned Magnetic Recording

X. G. Li,Z. J. Liu,A. G. Kang,X. Y. Xie

DOI: https://doi.org/10.1155/2017/4254029

IF: 3.791

2017-01-01

Journal of Nanomaterials

Abstract:A novel method utilizing response surface methodology (RSM) is proposed for effective analysis of the combined influence of writing head geometry and media properties on writing field performance. The method comprises two main modules: (1) a parametric writing head model based on finite element electromagnetic field analysis and (2) an effective writing field gradient model based on RSM. Using the method proposed, the writing performance of an asymmetrically shielded writing head for shingled magnetic recording on bit-patterned media (SMR-BPM) is analyzed. The results show that the shielding trailing gap and medium coercivity primarily impact the effective writing field (EWF) gradient and that the shielding side gap has a secondary impact. More importantly, the analysis shows a strong interaction effect between the influences of writing head geometry and medium coercivity on the EWF gradient, which indicates the need for inclusive design.