Calculating Model of Depolarization Coefficient for Microstructured Media

Jiang Xu,Weixian Qian,Qian Chen

DOI: https://doi.org/10.1016/j.optcom.2017.05.080

IF: 2.4

2017-01-01

Optics Communications

Abstract:As a new analytical method to study the propagation of polarized light, the system to classify the microstructure of a surface had been established. In this paper, the Jones Matrix and Mueller Matrix had been used to set up the physical model. By using the propagation path theory of polarized light, the mechanism of the scattering of electromagnetic wave had been observed, the relationship between the characteristics of depolarization and mechanism of scattering had been analyzed, and the relation formula of Mueller matrix, Mueller–Jones matrix and Isotropic-Depolarizer matrix had been deduced. Then combined with Fresnel formula, the depolarization coefficients of samples had been obtain, which was described the ability of material to weaken the polarization attribute of incident light. Finally, the theoretical model had been verified by experiments. The results showed that, the depolarization coefficients of the samples were related to the surface microstructure and scattering characteristics, and this model was more effectively to analyze the microstructure of the surface. Therefore, the model had a great application value, and the paper had very important significance on the development of polarization measurement technique.