Influence of Ti4+ Substitution for Ta5+ on the Crystal Structure, Raman Spectra, and Microwave Dielectric Properties of Ba3Ta4-4xTi4+5xO21 Ceramics
Junqi Chen,Ying Tang,Mingyang Yu,Changzhi Yin,Zhiwei Zhang,Huaicheng Xiang,Chunchun Li,Xianran Xing,Liang Fang
DOI: https://doi.org/10.1016/j.ceramint.2019.10.138
IF: 5.532
2020-01-01
Ceramics International
Abstract:This paper systematically investigated the influence of Ti4+ substitution for Ta5+ on the phase composition and microwave dielectric properties of Ba3Ta4.4xTi4+5xO21 (x = 0.1, 0.2, and 0.3) ceramics with hexagonal tungsten bronze-like structures. X-ray diffraction and Rietveld refinement results indicated that single-phase Ba3Ta4Ti4O21 could be obtained only with the x values of 0.1 and 0.2, and a secondary phase was detected at an x value of 0.3. The valence state of Ba3Ta4.4xTi4+5xO21 (x = 0.2) ceramics was analyzed through X-ray photoelectron spectroscopy. Increasing Ti4+/Ta5+ ratios could reduce sintering temperature and improve the microwave dielectric properties of Ba3Ta4.4xTi4+5xO21 solid solutions. However, the dielectric properties, particularly the quality factor, of Ba3Ta4.4xTi4+5xO21 ceramics deteriorated severely as a result of oxygen vacancy defects caused by the transition of the valence state from Ti4+ to Ti3+ when x = 0.2 and the coexistence of the secondary phase when x = 0.3. Infrared reflectivity spectroscopy was performed to explore the intrinsic dielectric properties of Ba3Ta4.4xTi4+5xO21 (x = 0.1) ceramics. The measured and extrapolated microwave dielectric properties of Ba3Ta4.4xTi4+5xO21 (x = 0.1) ceramics sintered at 1240 degrees C for 6 h were epsilon(r) similar to 46.5, Q x f = 13,900 GHz, tau(f) similar to + 49.4 ppm/degrees C, and epsilon(r) similar to 44, Q x f = 34,850 GHz.