Joining of Graphene Flakes by Low Energy N Ion Beam Irradiation

Xin Wu,Haiyan Zhao,Jiayun Pei,Dong Yan
DOI: https://doi.org/10.1063/1.4979166
IF: 4
2017-01-01
Applied Physics Letters
Abstract:An approach utilizing low energy N ion beam irradiation is applied in joining two monolayer graphene flakes. Raman spectrometry and atomic force microscopy show the joining signal under 40 eV and 1 × 1014 cm−2 N ion irradiation. Molecular dynamics simulations demonstrate that the joining phenomenon is attributed to the punch-down effect and the subsequent chemical bond generation between the two sheets. The generated chemical bonds are made up of inserted ions (embedded joining) and knocked-out carbon atoms (saturation joining). The electronic transport properties of the joint are also calculated for its applications.
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