Polarization Rotation in Copper Doped Zinc Oxide (zno:Cu) Thin Films Studied by Piezoresponse Force Microscopy (PFM) Techniques
Juanxiu Xiao,Tun Seng Herng,Jun Ding,Kaiyang Zeng
DOI: https://doi.org/10.1016/j.actamat.2016.10.051
IF: 9.4
2016-01-01
Acta Materialia
Abstract:In this study, the polarization rotation with approximately 180 degrees, i.e., the phenomenon that polarization changes its angle by similar to 180 degrees, in copper doped ZnO (ZnO:Cu) films under an applied electrical field are characterized by using Piezoresponse Force Microscopy (PFM) based techniques. First, the Band Excitation PFM (BE-PFM) measurements show that the polarizations in ZnO:Cu sample prefer the upward direction when the copper concentration is higher (above 8 at.%). Second, it is found that the piezoresponse property is enhanced with increasing the copper concentration. Third, by conducting PFM in spectroscopy mode (PFS), it reveals that the anomalous hysteresis loops occurs at certain locations and can be tuned to symmetry by increasing the bias window. Furthermore, it is found the built-in field during the DC poling processes are contributed by the oxygen vacancy in the films. The PFS results from as-grown sample and samples annealed in air and vacuum also verify that the oxygen vacancy plays an important role in the polarization rotation. Finally, by using the switching spectroscopy PFM (SS-PFM) technique, it is confirmed that the local polarization rotation is mediated by copper concentration. The parameters determined from the PFS measurements, including positive and negative coercive bias, V-p and V-n, coercive bias, E-c, maximum and remanent switchable responses, R-s and R-o, all increase with the copper concentration. (C) 2016 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.