An On-Chip Thermal Stress Evaluation Method for Silicon Resonant Accelerometer

Guoming Xia,Qin Shi,Anping Qiu,Xuehao Yu,ZhongHai Pei
DOI: https://doi.org/10.1109/icsens.2016.7808511
2016-01-01
Abstract:This paper reports a method of measuring the on-chip thermal stress for silicon resonant accelerometer (SRA). This method could be used to evaluate the stress-temperature characteristic of SRA, and that would help to focus the problems exist in SRA. Clamp-clamp Double Ended Turning Fork resonator is used as a basic measurement unit. Analysis of the accuracy and noise in stress measurement is given. An implementation of this method on a silicon resonant accelerometer is detail described. The Experiment shows that the on-chip thermal stress could be precisely measured, and the test result shows a more clear view of the state of the individual SRA.
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