An Integrated High-Performance Ratio-Metric Wavelength Measurement Device on Glass

Gencheng Wang,Bing Yang,Ao Shen,Chongyang Pei,Longzhi Yang,Hui Yu,Xiaoqing Jiang,Yubo Li,Yinlei Hao,Jianyi Yang
DOI: https://doi.org/10.1088/2040-8978/17/10/105802
IF: 2.1
2015-01-01
Journal of Optics
Abstract:The measurable wavelength range and the resolution of the ratio-metric wavelength monitor are limited by each other in a conventional structure. To solve this problem we designed and fabricated a high-performance integrated double ratio-metric wavelength measurement device on glass by the method of ion-exchange. It consists of four unbalanced Mach–Zehnder interferometers (MZIs) to form a rough wavelength measurement with a wide range and a fine wavelength measurement with high resolution. The highest measured resolution can reach 10 pm in a 1.6 nm-wide wavelength range for the fine wavelength measurement together with a 45 nm-wide wavelength range for the rough measurement. By heating the unbalanced MZI, the performance of the fine wavelength monitor can be improved.
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