Abstract:An integrated high-resolution ratio-metric wavelength monitor (RMWM) is demonstrated on SOI platform. The device consists of a reconfigurable demultiplexing filter based on cascaded thermally tunable microring resonators (MRRs) and Ge-Si photodetectors integrated with each drop port of the MRRs. The MRRs are supposed to achieve specific resonant wavelength spacing to form the “X-type” spectral response between adjacent channels. The ratio of the two drop power between adjacent channels varies linearly with the wavelength in the “X-type” spectral range, thus the wavelength can be monitored by investigating the drop power ratio between two pre-configured resonant channels. The functional wavelength range and monitor resolution can be adjusted flexibly by thermally tuning the resonant wavelength spacing between adjacent rings, and an ultra-high resolution of 5 pm or higher is achieved while the resonant spacing is tuned to 1.2nm. By tuning the resonant wavelength of the two MRRs synchronously, the monitor can cover the whole 9.6nm free spectral range (FSR) with only two ring channels. The power consumption is as small as 8 mW/nm. We also demonstrate the multi-channel monitor that can measure multi-wavelength-channel simultaneously and cover the whole FSR by presetting the resonant wavelengths of every MRR without any additional power consumption. The improvements to increase the resolution are also discussed.

Dual mach-Zehnder based integrated X-Type ratiometric wavelength monitor on glass

An Integrated High-Performance Ratio-Metric Wavelength Measurement Device on Glass

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