A Fully Integrated 0.055% INL X-ray CCD Readout ASIC with Incremental $\delta \sigma {\Text{adc}}$

Yanchao Wang,Xiaofei Cao,Qian Yu,Ting Yi,Bo Lu,Yong Chen,Zhiliang Hong
DOI: https://doi.org/10.1109/tns.2016.2543261
IF: 1.703
2016-01-01
IEEE Transactions on Nuclear Science
Abstract:A fully integrated 100 kHz X-ray charge coupled device (CCD) readout application specific integrated circuit (ASIC) employing delta sigma (Delta Sigma) digitization is presented. To achieve high linearity with small chip size and low power consumption, the correlated double sampling (CDS) is realized by the Sigma Delta ADC instead of the analog front end (AFE) as in conventional CCD readout circuits. Besides, the proposed decimation filter features simple structure and eases the integration. The chip is fabricated in 0.35 mu m CMOS technology and the measured integral nonlinearity (INL) throughout the input dynamic range of ASIC is 0.055% with 35.1 +/- 0.3 mu V input referred noise. A CCD detection system is built and tested with the sensitivity of CCD being 4 mu V/e(-). The integration test results show that the readout noise is 11.8 e(-) at 100 kHz readout pixel rate and the achieved energy spectrum resolution is 168 eV +/- 4.7 eV (Full Width at Half Maximum: FWHM) at 5.9 keV.
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