Abstract:This paper introduces a readout circuit structure tailored for high dynamic range CISs utilizing DCG imaging technology, using only one ADC for A/D conversion of HCG signals and LCG signals, which greatly reduces the area and power consumption of the readout circuit. Summary This paper introduces an area‐effective and low‐power readout circuit structure tailored for high dynamic range (HDR) CMOS image sensors (CISs) utilizing dual conversion gain (DCG) imaging technology. A switched capacitor amplifier, which is applied at the comparator input port of the column‐parallel single‐slope analog‐to‐digital converter (SS ADC), is proposed to compensate for the charge injection and clock feed‐through introduced when the pixel switches between high conversion gain (HCG) and low conversion gain (LCG) modes. The proposed SS ADC is supplemented by the integration of a configurable counter, and the counter is specifically crafted for performing the A/D conversion of the readout voltage within a DCG pixel. Compared to the conventional DCG readout circuit, the proposed readout circuit use only one ADC for A/D conversion of HCG signals and LCG signals, which greatly reduces the area and power consumption of the readout circuit. Simulation results under 110 nm CMOS technology illustrate that the proposed 10‐bit SS ADC has a DNL of +0.78/−0.91 LSB and an INL of +1.91/−1.69 LSB, with a SNR of 57.2 dB and a SNDR of 55.95 dB, corresponding to an ENOB of 9 bits. The power consumption of the proposed SS ADC is 56.4 μW per column with a conversion time of 12 μs, and the simulation results show that the power consumption is 23.35% lower than the conventional structure and the area is saved by 24.69%.

A Low-Power 14-Bit Hybrid Incremental Sigma-Delta/cyclic ADC for X-ray Sensor Array

A 14-Bit Column-Parallel Two-Step SA ADC with On-Chip Scaled Reference Voltages Self-Calibration for CMOS Image Sensor

A Low-Power 14-Bit Two-Stage Hybrid Adc for Infrared Focal Plane Array Detector

A 14-Bit Column-Parallel Two-Step SA ADC with Digital Calibration Based on Scaled References and Redundancy for CMOS Image Sensors

14-Bit Column Readout Circuits with Single-to-differential PGA Using Intentional Offset and Two-Step Scaled-Reference SAR ADC for CMOS Image Sensors

A 14-Bit Hybrid Incremental Sigma-Delta/Cyclic ADC for X-ray Linear Array Sensor

A Low-power High-resolution Band-pass Sigma-delta ADC for Accelerometer Applications

A 16-Bit 64-Channel 2-Order Incremental Σ-Δ ADC with On-Chip Decimator for X-ray Detections

A 13-Bit, Low-Power, Compact Adc Suitable for Sensor Applications

A 1.8-V 14-bit inverter-based incremental ΣΔ ADC for CMOS image sensor.

A 1.8-V 14-Bit Inverter-Based Incremental Sigma Delta Adc For Cmos Image Sensor

An area‐effective and low‐power single‐slope ADC for DCG imaging CMOS image sensor

A low power 10‐bit 1 MS/s cyclic analog to digital converter for complementary metal oxide semiconductors image sensors with comparator‐based switched‐capacitor technique

A 12-Bit Cyclic ADC for Image Sensor

A 12-bit compact column-parallel SAR ADC with dynamic power control technique for high-speed CMOS image sensors

An ultra-low-power extended counting ADC For large scale sensor arrays

A Low Power Double-Sampling Extended Counting Adc with Class-Ab Ota for Sensor Arrays

A Low Power Cyclic ADC Design for a Wireless Monitoring System for Orthopedic Implants

A Low-Power Single-Slope Based 14-Bit Column-Level ADC for 384×288 Uncooled Infrared Imager

A 14-Bit Two-Segment Column-Level ADC for Remote Sensing Imaging

A Low-Power Column-Parallel Gain-Adaptive Single-Slope ADC for CMOS Image Sensors