Abstract:This paper presents an innovative readout scheme that utilizes a pair of differential‐clocks‐assisted time‐to‐digital converter (DCA‐TDC) in CISs. The DCA‐TDC utilizes only half the number of ordinary TDC delay chain units by employing a binary‐weighted search algorithm to determine the MSB for fine quantization of a SS ADC. Additionally, the layout area and dynamic power introduced by the improved DCA‐TDC delay chain are halved compared to an ordinary TDC delay chain. This paper presents an innovative readout scheme that utilizes a pair of differential‐clocks‐assisted time‐to‐digital converter (DCA‐TDC) in CMOS image sensors (CISs). The DCA‐TDC utilizes only half the number of ordinary TDC delay chain units by employing a binary‐weighted search algorithm to determine the most significant bit (MSB) for fine quantization of a single‐slope analog‐to‐digital converter (SS ADC). Additionally, the layout area and dynamic power introduced by the improved DCA‐TDC delay chain are halved compared to an ordinary TDC delay chain. The proposed SS ADC is designed and simulated using the 0.11 μ m standard CMOS proces, achieving an 11‐bit ADC with a column‐level power consumption of 65.4 μ W, and a row conversion time of 2.72 μ s, within a design environment featuring an analog voltage of 3.3 V, a digital voltage of 1.5 V, a clock frequency of 62.5 MHz, and a temporal resolution of 500 ps. Furthermore, this design achieves an effective number of bits (ENOB) of 10.71 and a figure of merit (FoM) of 110.5 fJ/step. By interpolating a DCA‐TDC, the quantization speed is enhanced compared to traditional SS ADCs, presenting an effective solution for high‐frame‐rate CIS implementations.

A 12-Bit Cyclic ADC for Image Sensor

A 14-Bit Column-Parallel Two-Step SA ADC with On-Chip Scaled Reference Voltages Self-Calibration for CMOS Image Sensor

14-Bit Column Readout Circuits with Single-to-differential PGA Using Intentional Offset and Two-Step Scaled-Reference SAR ADC for CMOS Image Sensors

A 14-Bit Column-Parallel Two-Step SA ADC with Digital Calibration Based on Scaled References and Redundancy for CMOS Image Sensors

A 10-Bit 250-KS/s 1.24-uW SAR ADC for IoT Sensors with Energy-Efficient Comparator.

A 14-bit 150KS/s SAR ADC with PGA for CMOS Image Sensor

An area‐effective and low‐power single‐slope ADC for DCG imaging CMOS image sensor

A 12-bit compact column-parallel SAR ADC with dynamic power control technique for high-speed CMOS image sensors

A 1.8-V 14-Bit Inverter-Based Incremental Sigma Delta Adc For Cmos Image Sensor

A low power 10‐bit 1 MS/s cyclic analog to digital converter for complementary metal oxide semiconductors image sensors with comparator‐based switched‐capacitor technique

A 1.8-V 14-bit inverter-based incremental ΣΔ ADC for CMOS image sensor.

An Energy-Efficient Readout Circuit Based on Incremental Delta-Sigma ADC with Decimation Filter for CMOS Image Sensors

A Low-Power 14-Bit Hybrid Incremental Sigma-Delta/cyclic ADC for X-ray Sensor Array

A 10bit Small Area Low Power Pipelined Sar Adc Used in Cmos Image Sensor

A 13-Bit, Low-Power, Compact Adc Suitable for Sensor Applications

A Low-Power Column-Parallel Gain-Adaptive Single-Slope ADC for CMOS Image Sensors

A 12-Bit 96Msample/s double-data-rate (DDR) pipeline ADC with speed and noise optimization for CMOS image sensors

A 10-bit 20-Msample/s 49mW CMOS pipelined A/D converter

Design of a Pipelined SAR ADC Used in CMOS Image Sensor

Continuous-time ΣΔ ADC with implicit variable gain amplifier for CMOS image sensor

A 2.72 μ s row conversion time 11‐bit column‐parallel single‐slope analog to digital converter with differential‐clocks‐assisted time to digital converter interpolation for complementary metal oxide semiconductors image sensor