Power Circuit's Thermal Effect to Drive/Protection Circuits Inside Hybrid IPEM

曾翔君,余小玲,王晓宝,杨旭,王兆安
DOI: https://doi.org/10.3969/j.issn.1005-9490.2004.01.005
2004-01-01
Abstract:The research on the integrated power electronic module (IPEM) based on hybrid packaging technology at the medium power rate has been paid much attention to recently. When assembled with power chips very compact, the drive/ protection circuits will be seriously affected by the heat from power chips. This problem has been studied. A 3D Finite Element model of a wire-bonding IPEM is presented to analyze the thermal behavior and temperature rise inside the module . Specially, the temperature rise of the drive/protection circuits is evaluated and the experimental verification is given. When the module is encapsulated by silicon gel, but an air gap is sandwiched between power chips and drive/protection circuits, the thermal transfer problem of this module is studied experimentally.
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