Dielectric Loss Measurement Method Based on Quasi-synchronous DFT

王爱国,杨仕友,倪光正,陈宗辉
DOI: https://doi.org/10.3969/j.issn.1003-6520.2004.10.018
2004-01-01
Abstract:Due to the system frequency fluctuation, the signal frequency would be non-integer times of the sampling frequency and the leakage effect appears, thus, the accuracy of the dielectric loss measurement based on the DFT method can not meet the standard requirement. However, the result of the phase angle difference measurement based on the Quasi-synchronous DFT method is much more accurate than that based on the DFT method, when the sampling is non-synchronous. Thereby, in this paper, a method based on the Quasi-synchronous DFT method is proposed to measure the dielectric loss. The results of the simulation, under the condition that the frequency is fluctuating and current and voltage signals have different initial phase angles, have demonstrated that the measurement accuracy of the proposed method is enhanced significantly.
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