Depth profiling cross-linked poly(methyl methacrylate) films: a time-of-flight secondary ion mass spectrometry approach.

Soheila Naderi-Gohar,Kevin M H Huang,Yiliang Wu,Woon Ming Lau,Heng-Yong Nie

DOI: https://doi.org/10.1002/rcm.7801

IF: 2.586

2017-01-01

Rapid Communications in Mass Spectrometry

Abstract:RATIONALE: In order to determine the degree of cross-linking on the surface and its variations in a nanometer-scale depth of organic materials, we developed an approach based on time-of-flight secondary ion mass spectrometry (TOF-SIMS), which provides rich chemical information in the form of fragment ions. TOF-SIMS is extremely surface-sensitive and capable of depth profiling with the use of a sputter ion beam to remove controllable amounts of substance. METHODS: Poly(methyl methacrylate) (PMMA) films spin-coated on a Si substrate were cross-linked using a recently developed, surface sensitive, hyperthermal hydrogen projectile bombardment technique. The ion intensity ratio between two ubiquitous hydrocarbon ions, C6H- and C4H-, detected in TOF-SIMS, denoted as., was used to assess the degree of cross-linking of the PMMA films. The cross-linking depth of the PMMA films was revealed by depth profiling. into the polymer films using a C-60(+) sputter beam. RESULTS: The control PMMA film spin-coated on a Si substrate was characterized by rho = 32% on its surface when using a 25 keV Bi-3(+) primary ion beam. This parameter on the PMMA films subjected to HHIC treatment for 10, 100 and 500 s increased to 45%, 56% and 65%, respectively. The depth profiles of rho obtained using a 10 keV C-60(+) ion beam resembled an exponential decay, from which the cross-linking depth was estimated to be 3, 15 and 39 nm, respectively, for the three cross-linked PMMA films. CONCLUSIONS: We demonstrated that the ion intensity ratio of C6H- to C4H- detected in TOF-SIMS provides a unique and simple means to assess the degree of cross-linking of the surface of PMMA films cross-linked by the surface sensitive hyperthermal hydrogen projectile bombardment technique. With a C-60(+) sputter beam, we were able to depth profile the PMMA films and determine cross-linking depths of the cross-linked polymer films at nanometer resolutions. Copyright (C) 2016 John Wiley & Sons, Ltd.