Prediction on Response to the Thermal Fatigue of Through-Hole Solder Joint I. Experimental Research of Solder Joint Response to the Thermal Fatigue

Y Ding,CQ Wang,YH Tian
DOI: https://doi.org/10.3321/j.issn:0412-1961.2003.08.020
IF: 1.797
2003-01-01
ACTA METALLURGICA SINICA
Abstract:Experimental investigations on the reliability of through-hole solder joints under thermal shock were carried out in this paper. The difference responses of wave and reflow soldered joints to thermal fatigue was analysized in non-destructive and destructive testing ways. Results show that the cumulative damage to the solder metal is mostly caused by the coefficient of thermal expansion (CTE) mismatch. And the crack-propagation extents in both joints are dissimilar due to the difference of solder joint shape. Cracks are observed in the solder body to the reflowed samples, while they appear obviously at the corner of printed circuit board (PCB)-plated through hole (PTH) barrel interface in the wave soldered samples. Furthermore, the formation of cracks results in the degradation of solder joint strength, but affects mildly to the electrical properties.
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