Abstract:In order to service an ever-growing base of legacy electronics, both government and industry customers must turn to third-party brokers for components in short supply or discontinued by the original manufacturer. Sourcing equipment from a third party creates an opportunity for unscrupulous gray market suppliers to insert counterfeit devices: failed, knock-off, or otherwise inferior to the original product. This increases the supplier's profits at the expense of reduced performance/reliability of the customer's system. The most challenging class of counterfeit devices to detect is recycled counterfeits: recovered genuine devices which are re-sold as new. Such devices are difficult to detect because they typically pass performance and parametric tests but fail prematurely due to age-related wear. To address the challenge of detecting recycled devices pre-deployment, we develop Silicon Dating: a low-overhead classifier for detecting recycled integrated circuits using Static Random-Access Memory (SRAM) power-on states. Silicon Dating targets devices with no known-new record or purpose-built anti-recycling hardware. We observe that over time, software running on a device imprints its unique data patterns into SRAM through analog-domain changes; we measure the level and direction of this change through SRAM power-on state statistics. In contrast to highly symmetric power-on states produced by variation during SRAM fabrication, we show that embedded software data is generally highly asymmetric and that the degree of power-on state asymmetry imprinted by software reveals device use. Using empirical results from embedded benchmarks running on several microcontrollers, we show that Silicon Dating identifies recycled devices with 84.1% accuracy with no software-specific knowledge and with 92.0% accuracy by incorporating software knowledge---without prior device enrollment or modification.

Comprehensive Detection of Counterfeit ICs Via On-Chip Sensor and Post-Fabrication Authentication Policy.

A New Aging Sensor for the Detection of Recycled ICs

A Novel Counterfeit Detection Approach for Integrated Circuit Supply Chain Assurance

Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges Ahead

A Non-invasive Technique to Detect Authentic/Counterfeit SRAM Chips

Counterfeit Chip Detection using Scattering Parameter Analysis

Evaluating a Multimodal, Non-Destructive Approach Combining a Resonant Cavity System and Infrared Spectroscopy to Detect Counterfeit and Anomalous Integrated Circuits

Exploiting Nanoelectronic Properties of Memory Chips for Prevention of IC Counterfeiting

Circuit Partitioning Based Fingerprinting Method for IP Protection

Fringing Electric Field Sensors for Anti-Attack at System-Level Protection

A Novel Authorization Methodology to Prevent Counterfeit PCB/Equipment through Supply Chain

Contact-Less Integrity Verification of Microelectronics Using Near-Field EM Analysis

Inter-Chip Authentication through I/O Character

Counterfeiting Detection in RFID-enabled Supply Chain

A Novel Authentication Methodology to Detect Counterfeit PCB Using PCB Trace-Based Ring Oscillator

Hardware Trojans in Chips: A Survey for Detection and Prevention

Secure Electronics Enabled by Atomically Thin and Photosensitive Two-Dimensional Memtransistors

Supply Chain Security of IC Chips: Problems and Solutions for Authenticity under Threat

Silicon Dating

Aging Adaption in Integrated Circuits Using a Novel Built-In Sensor

Towards the Avoidance of Counterfeit Memory: Identifying the DRAM Origin