Single-Layer Wide-Angle Scanning Linear Phased Arrays Based on Multimode Microstrip Patch Elements
Dongsheng Li,Jie Yang,Jianing Zhao,Yongzhen Dong,Hao Li,Tianming Li,Haiyang Wang,Biao Hu,Yihong Zhou,Fang Li,Ruoyang Yang
DOI: https://doi.org/10.3390/mi15010003
IF: 3.4
2023-12-20
Micromachines
Abstract:This paper introduces a novel single-layer microstrip patch element designed to achieve a wide beamwidth, in order to address the growing demand for wide-angle scanning capabilities in modern phased array systems. The proposed element, comprising a slot-etched circular patch and an array of metallized holes arranged in square rings, offers a unique approach to beam shaping. By carefully adjusting parameters such as the slot structure and feeding position, our element is engineered to simultaneously excite both the TM01 and TM21 modes, a key feature that contributes to its wide beamwidth characteristics. Through the constructive interference of these modes, our element demonstrates a remarkable 3 dB beamwidth of approximately 150° in both principal planes, showcasing its potential for wide-angle scanning applications. To validate the practical performance of this proposed element, two linear phased arrays are manufactured and experimentally evaluated. The simulation results confirm the wide-angle scanning capability of the antennas in both the E-plane and H-plane. Furthermore, the experimental assessment demonstrates that these linear phased arrays can effectively generate scanning beams within a frequency range of 25 GHz to 28 GHz, covering a wide angular range from −60° to 60°, while maintaining a gain loss within 3 dB. This innovative design approach not only offers a promising solution for achieving a wide beamwidth in microstrip patch elements, but also holds significant potential for the development of cost-effective phased arrays with wide-angle scanning capabilities, making it a valuable contribution to the advancement of phased array technology.
chemistry, analytical,nanoscience & nanotechnology,instruments & instrumentation,physics, applied