Sensitivity of ZnO Film-Based X-ray Sensors: A Comprehensive Study on the Effect of Thickness of ZnO Layer

Jigyas Das,J.M. Kalita
DOI: https://doi.org/10.1021/acsami.4c01791
IF: 9.5
2024-04-13
ACS Applied Materials & Interfaces
Abstract:For all types of photosensors, efficient absorption of photons of particular interest is very essential. We report the effect of thickness of the ZnO layer in ZnO film-based X-ray sensors. A set of five samples Z1, Z2, Z3, Z4, and Z5 is developed by varying the thickness of the ZnO layer between 10 and 73 μm. The dark I-V characteristics of the sensors show a "pseudorectifying" type nature. A quantitative analysis of the dark currents reveals that the dark I-V characteristics are affected by...
materials science, multidisciplinary,nanoscience & nanotechnology
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