Vertical power diodes based on bulk GaN substrates

Liang Zheng,Lin-Jie Yu,Lin Chen,Qing-Qing Sun,Wei Huang,Hao Zhu,David Wei Zhang
DOI: https://doi.org/10.1109/ASICON.2017.8252437
2017-01-01
Abstract:In this work, study on electrical properties of vertical GaN power diodes, including schottky barrier diodes (SBD) and p-n diodes, are presented. The devices with various drift layer thickness and net carrier electron concentration were simulated using the Silvaco ATLAS TCAD software packages. What's more, an optimum design of vertical GaN devices with drift layer thickness 10μm and net carrier doping concentration 1 × 10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">16</sup> cm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</sup> were fabricated. These devices, including Schottky barrier diodes with a breakdown voltage of 2250 V and specific on-resistance of 0.9 mΩ·cm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">-2</sup> , and p-n diode with a breakdown voltage of 2400 V and specific on-resistance of 0.85 mΩ·cm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">-2</sup> , exhibited excellent electric properties.
What problem does this paper attempt to address?