Abstract:Physically Unclonable Functions (PUFs) have proved to be an effective and low-cost measure against counterfeiting by providing device authentication and secure key storage services. Memory-based PUF implementations are an attractive option due to the ubiquitous nature of memory in electronic devices and the requirement of minimal (or no) additional circuitry. Dynamic Random Access Memory-- (DRAM) based PUFs are particularly advantageous due to their large address space and multiple controllable parameters during response generation. However, prior works on DRAM PUFs use a static response-generation mechanism making them vulnerable to security attacks. Further, they result in slow device authentication, are not applicable to commercial off-the-shelf devices, or require DRAM power cycling prior to authentication. In this article, we propose D-PUF, an intrinsically reconfigurable DRAM PUF based on the idea of DRAM refresh pausing. A key feature of the proposed DRAM PUF is reconfigurability, that is, by varying the DRAM refresh-pause interval, the challenge-response behavior of the PUF can be altered, making it robust to various attacks. The article is broadly divided into two parts. In the first part, we demonstrate the use of D-PUF in performing device authentication through a secure, low-overhead methodology. In the second part, we show the generation of true random numbers using D-PUF. The design is implemented and validated using an Altera Stratix IV GX FPGA-based Terasic TR4-230 development board and several off-the-shelf 1GB DDR3 DRAM modules. Our experimental results demonstrate a 4.3×-6.4× reduction in authentication time compared to prior work. Using controlled temperature and accelerated aging tests, we also demonstrate the robustness of our authentication mechanism to temperature variations and aging effects. Finally, the ability of the design to generate random numbers is verified using the NIST Statistical Test Suite.

A Highly Reliable and Tamper-Resistant RRAM PUF: Design and Experimental Validation.

A Highly Reliable RRAM Physically Unclonable Function Utilizing Post-Process Randomness Source

Exploiting resistive cross-point array for compact design of physical unclonable function

Design and optimization of strong Physical Unclonable Function (PUF) based on RRAM array

A Homogeneous, Reconfigurable, and Efficient Implementation of PUF in 3-D Selector-Free RRAM

Extending 1kb RRAM array from weak PUF to strong PUF by employment of SHA module

Optimization of Rram-Based Physical Unclonable Function with A Novel Differential Read-Out Method

A High Area-Efficiency RRAM-Based Strong PUF with Multi-Entropy Source and Configurable Double-Read Process

An Ultracompact Switching-Voltage-Based Fully Reconfigurable RRAM PUF with Low Native Instability

A Novel PUF Using Stochastic Short-Term Memory Time of Oxide-Based RRAM for Embedded Applications

A Novel RRAM Based PUF for Anti-Machine Learning Attack and High Reliability

A novel PUF against machine learning attack: Implementation on a 16 Mb RRAM chip

A 28 nm 512 Kb adjacent 2T2R RRAM PUF with interleaved cell mirroring and self-adaptive splitting for high density and low BER cryptographic key in IoT devices

A Physically Unclonable Function with BER < 0.35% for Secure Chip Authentication Using Write Speed Variation of RRAM.

Experimental Characterization of Physical Unclonable Function Based on 1 kb Resistive Random Access Memory Arrays

A Time-delay based RRAM PUF Circuit

A 28nm 512kb Adjacent 2T2R RRAM PUF with Interleaved Cell Mirroring and Self-Adaptive Splitting for Extremely Low Bit Error Rate of Cryptographic Key.

D-PUF: An Intrinsically Reconfigurable DRAM PUF for Device Authentication and Random Number Generation.

25.2 A Reconfigurable RRAM Physically Unclonable Function Utilizing Post-Process Randomness Source with <6×10−6 Native Bit Error Rate

A Novel PUF Based on Cell Error Rate Distribution of STT-RAM

A Novel Bi-functional Memory-PUF Module Utilizing Adjustable Switching Window of RRAM