An Effective Power Grid Optimization Approach for the Electromigration Reliability

Ming Yan,Yici Cai,Chenguang Wang,Qiang Zhou
DOI: https://doi.org/10.1109/isvlsi.2017.85
2017-01-01
Abstract:An effective optimization approach for the electromigration (EM) reliability in power grid (PG) has been presented in this paper. With core technology development and the key feature size of integrated circuits decreasing, it is more serious for the EM-induced failure occurrence in the entire PG. However, previous PG studies focus on supply noise optimization and neglect the EM influence in lines, especially transient effects of EM phenomenon, and researches in EM reliability are purely confined to local branches or segments now. In the paper, we propose an optimization approach to dealing with EM failure problem in the entire PG, which could effectively lengthen lifetime of the entire circuit in the case that supply noise can be guaranteed. In addition, a composite method flow has been proposed to illustrate the connection between the two optimizations. Experimental results show that our proposed method achieves the goal of transient EM analysis and optimization with supply noise constraints guaranteed. Meanwhile, COMSOL simulation results also confirm effectiveness of the PG optimization approach. For several different scale PG benchmarks, our method can lengthen lifetime of the entire circuit approximately by 10% with the area overhead increased only by 1% within reasonable runtime.
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