Testing of 1tnr RRAM Array with Sneak Path Technique

Xiaole Cui,Qiang Zhang,Xiaoxin Cui,Xinan Wang,Jinfeng Kang,Xiaoyan Liu
DOI: https://doi.org/10.1007/s11432-016-0015-7
2016-01-01
Science China Information Sciences
Abstract:>Dear editor,RRAM is regarded as one of the most promising candidates among emerging nonvolatile memory technologies[1,2].Recently,the 1Tn R RRAM structure,in which n RRAM cells in each row share a common bottom electrode connected to the drain node of a selector transistor,was proposed to improve the integration density[3,4].The area of the 1T4R RRAM test chip is 30%smaller than that of the conventional 1T1R cell[3].However,the complexity of the conventional
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