Dielectric Behavior of La 2 O 3 -Modified 0.4(ba 0.8 Ca 0.2 )tio 3 –0.6bi(mg 0.5 Ti 0.5 )O 3 Lead-Free Ceramics

Xiaoqi liu,Laijun Liu,Feifei Han,Saisai Liu,Huaicheng Xiang,Liang Fang

DOI: https://doi.org/10.1007/s10854-016-5365-9

2016-01-01

Journal of Materials Science Materials in Electronics

Abstract:0.4(Ba0.8Ca0.2)(1−x)La2x/3TiO3–0.6Bi(Mg0.5Ti0.5)O3 (x = 0.00, 0.15, 0.30) ceramics were prepared by a conventional mixed oxide route. Crystal structure of the ceramics was determined using XRD. Dielectric constant of the samples decreases with the increase of La content, however, the temperature stability of dielectric constant was improved. For x = 0.3, a near-plateau dielectric constant 700 ± 80, extended across the temperature range, 30–550 °C (at 1 kHz) was obtained. The corresponding loss tangent, tan δ, was ≤0.025 in the temperature range from 93 to 353 °C. All samples show a relaxor behavior and measurement frequency and the temperature (T m ) corresponding to the maximum of dielectric constant follow the Vogel–Fulcher relationship. Compared the dielectric properties of the samples with other materials, the former has highly attractive for developing capacitors over a wide working temperature range.