Investigations on Scan Scale and Other Issues of AFM Measurements for Surface Roughness of Hastelloy C276

冯峰,瞿体明,肖绍铸,张燕怡,史锴,韩征和

DOI: https://doi.org/10.13373/j.cnki.cjrm.2014.02.007

2014-01-01

Abstract:Hastelloy C276 was a widely used nickel-based alloy, due to its advantages of mechanical and anti-corrosion properties. In the fabrication of second generation high temperature superconducting wires via the ion beam assisted deposition (IBAD) route, Hastelloy served as the metallic substrate, therefore, the polishing and roughness measurements of its surface were concerned worldwide. Atomic force microscopy (AFM) was generally applied to characterize the surface morphology and roughness of Hastelloy. The scan scale played an important role in AFM measurements. In this study, two Hastelloy tape samples, electro polished and mechanically polished respectively, were measured at different scan scales ranging from 1 to 70 μm. An overall understanding of their surface morphologies could be achieved, and the surface roughness was found to increase with the scan scale. The differences of electro polishing and mechanically polishing were carried out to consider the scale variation. Besides, the effect of flatten order in the post processing of AFM images was analyzed. The roughness calculation of smaller parts divided out of AFM images was modified. And the repeatability of AFM measurement for surface roughness was also discussed. Some necessary principles could be proposed for the roughness measurement by AFM based on above investigations, improving the comprehensiveness and effectiveness.