A Cascade-Parallel Based Noise De-Embedding Technique for RF Modeling of CMOS Device

X. S. Loo,K. S. Yeo,K. W. J. Chew,L. H. K. Chan,S. N. Ong,M. A. Do,C. C. Boon
DOI: https://doi.org/10.1109/lmwc.2011.2158533
IF: 3
2011-08-01
IEEE Microwave and Wireless Components Letters
Abstract:In this letter, a unique cascade-parallel based noise de-embedding technique is presented for on-wafer device characterization and modeling. It utilizes two fully shielded THRU line structures and one OPEN structure that enable simultaneously de-embedding of series contact resistance, forward coupling and distributed parasitics of interconnect. Thus, it is more suitable for RF/millimeter wave noise characterization of lossy CMOS devices as compared to conventional lumped and cascade based de-embedding techniques. The proposed noise de-embedding technique is verified on both zero length THRU and OPEN devices. It demonstrates a better high frequency de-embedding performance than existing cascade based techniques by showing 1dB improvement in predicted NFmin of 0.13 $\mu{\rm m}$ CMOS devices at 60 GHz. This is consistent with the further validation result on the de-embedded gain performance of the transistor.
engineering, electrical & electronic
What problem does this paper attempt to address?